An Investigation of Reliability and Life Time Prediction for Power MOSFET Using Electronically and Statistical Technique
An Investigation of Reliability and Life Time Prediction for Power MOSFET Using Electronically and Statistical Technique

Abdul-hasan Abdallah Kadhim; Munaf Fathi Badr; Abdulkhaliq A.AL-Naqeeb

Volume 31, 4 B , April 2013, , Page 551-558

https://doi.org/10.30684/etj.31.4B.13

Abstract
  This work is aimed to estimate the life time of the MOSFET power transistor through an empirical implementation work merged with statistical applications. In the empirical part the ...  Read More ...