A Mixture between Rule 90 and Rule 150 Cellular Automata as a Test Pattern Generator
A Mixture between Rule 90 and Rule 150 Cellular Automata as a Test Pattern Generator

Sahar Z. Alawey

Volume 36, 9A , September 2018, , Page 951-956

https://doi.org/10.30684/etj.36.9A.2

Abstract
  Built-in Self-test (BIST) is one of integrated circuit (IC) testing techniques that can be used as a pseudo-random generator for the Circuit Under Test (CUT). This paper introduces ...  Read More ...