Engineering and Technology Journal

Keywords = Ellipsometry

Number of Articles: 2
Data Acquisition of TiO2 for Optical Material by using Spectroscopic Ellipsometry Technique
Data Acquisition of TiO2 for Optical Material by using Spectroscopic Ellipsometry Technique

Asad Sabih Mohammad Raouf

Volume 28, Issue 20 , October 2010, , Page 6128-6139

https://doi.org/10.30684/etj.28.20.12

Abstract
  An Ellipsometric experimental set up of SOPRA ES4G type with a powerfulWVASE software for the theoretical calculus of the Ellipsometry parameters. TheEllipsometry Technique can determine ...  Read More ...
Study on Temperature and Etching Effects on Silicon Oxide Formation Using Laser Ellipsometric Method
Study on Temperature and Etching Effects on Silicon Oxide Formation Using Laser Ellipsometric Method

Z. Yahiya Khalid; . Al-Baldawi AmmarM; H. Jraiz Ammar

Volume 25, Issue 6 , August 2007, , Page 797-807

https://doi.org/10.30684/etj.25.6.8

Abstract
  In this paper, a laser ellipsometric method is implemented to study theformation of oxide films on silicon substrate at room temperature in air. Twolasers, He-Ne and semiconductor diode, ...  Read More ...