Print ISSN: 1681-6900

Online ISSN: 2412-0758

Keywords : Nickel Oxide


Preparation of Nickel Oxide Microparticles by Pulsed Laser Ablation and Application to Gas Sensors

Nedal A. Hussain; Luma Y. Abbas; Lamyaa A. Latif

Engineering and Technology Journal, 2021, Volume 39, Issue 6, Pages 1011-1018
DOI: 10.30684/etj.v39i6.1593

Nickel oxide (NiO) microparticles were synthesized by pulsed laser ablation in double deionized water and intensively studied using Nd:YAG laser. The obtained sample was examined by X-ray diffraction, XRD measurement which tests the existence of polycrystalline. The structural parameters introduced and surface morphology was studied using field emission scanning electron microscopy devices. The optical properties of microparticles in a liquid were investigated through UV-VIS spectroscopy. The CO/CO2 sensing properties of the NiO microstructure sensors were systematically investigated, and the effects of different laser fluencies on the CO/CO2 sensing characteristics were analyzed. XRD measurements reflected the existence of polycrystalline, the optical result shows that The absorption spectra peak centered around 360 nm and a tail extending to the red region (600 nm), the scanning electron microscopy images showed that the morphologies of NiO thin films have microspheres in various. The sample affected by laser fluence 1.9 J/cm2 which exhibits the best sensitivity for CO2 gas.

Structural and Optical Characterization of Nickel Oxide Thin Films Prepared by Spray Pyrolysis Technique

Fadheela H. Oleiwe

Engineering and Technology Journal, 2015, Volume 33, Issue 8, Pages 1503-1512

In this research, Nickel oxide (NiO) thin film were prepared by using nickel chloride ( NiCl2.6H2O) on glass substrate by using Spray Pyrolysis technique. The Structural and optical properties were studied for the growth thin films under influence different molarities (0.5,1,2 M) by XRD , SEM . The optical properties studied in the wavelength range from 200-1100nm measured by UV-VIS Spectrometer device.
The X-ray diffraction studies indicated that intensity was increased with molarities increase and had cubic structure , these films has grain size values (4.13-11.95 nm) with different molarities (0.5, 1 , 2M) , SEM found the films has smooth surface with grains scattered throughout the surface and the surface the films filled with the clusters of the larger grains the at increase molarities and AFM it is found the (RMS) of NiO films increased from 7.77 to 20.7 nm and the roughness average increased from 5.73-15.6 nm with the increase of molarities from 0.5-2 M .
From the optical studies it is found the film thickness increased with molarities increase, while the transmittance decreased from approximately 75% to approximately 54% and the energy gap for the NiO films varies from ( 3.65 to 3.1eV) as the molarities increase.