Waseem Najeeb Ibrahim
Abstract
In this paper n-CdSe/p-Si heteroj unction photodetector was fabricated bythermal-evaporation technique of CdSe thin film grown onto single crystalline Sisubstrate . The energy gap of ...
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In this paper n-CdSe/p-Si heteroj unction photodetector was fabricated bythermal-evaporation technique of CdSe thin film grown onto single crystalline Sisubstrate . The energy gap of CdSe film was estimated from transmittance spectraand found to be (1.89 eV) . The temperature dependence of Seebeck coefficientwas studied . The conductivity of CdSe thin film is n-type and the value ofactivation energy is (0.59 eV). Heterojunction properties included dark andilluminated current-voltage (I-V) and capacitance-voltage (C-V) characteristics.From I-V plot, junction ideality factor for heterojunction was calculated to be1.43, and providing information about the current transport mechanism. The linearvariation of the experimental curve C-2 vs. V is indicative of the presence ofabrupt heterojunction and it used to determine the experimental value of built-injunctionpotential Vbi . From illuminated I-V plot at different intensity levels(90,180,240) mW/cm2 , the linearity behavior of CdSe/Si heterojunction wasinvestigated .