N. N. Rammo; M. Abd-Sattar Mohammed; A. H. Abd Al-Razak
Abstract
Changes in the crystalline domains caused by heat treating Mylar filmsbetween Tg to 240 oC have been studied by Fourier Transform Infraredspectroscopy (FTIR) and X-ray Diffraction (XRD). ...
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Changes in the crystalline domains caused by heat treating Mylar filmsbetween Tg to 240 oC have been studied by Fourier Transform Infraredspectroscopy (FTIR) and X-ray Diffraction (XRD). Prior to glass transition temperature, shrinkage in the film is insignificant, but progresses rather abruptly as melting point is approached bringing the smooth film surface to rather wrinkle.The absorbance increase in the FTIR spectra is due to the thickened film caused by shrinking rather than the improvement in the crystalline orientation. XRD on the other hand show that heat treatment of the film near melting point only reduces the contribution of the crystalline domains in the direction [100] in favor of other direction namely rather than on the account of loosing order in favor of the amorphous regions.
