Print ISSN: 1681-6900

Online ISSN: 2412-0758

Keywords : structural properties

Preparation and Characterization of (Tio2-Sno2) Thin Films by Pulsed Laser Deposition

Saja H.Rashed; Adawiya J. Haider; Samar Younis

Engineering and Technology Journal, 2014, Volume 32, Issue 4, Pages 658-665

In this work, mixed oxide (TiO2-SnO2) thin films were grown on Si (111) and glass substrates by pulsed laser deposition (PLD) method. The influences of increasing amounts of SnO2 were investigated. The X-ray diffraction results show the peaks position of the plane was shifted towards higher angle values with increasing amounts of SnO2. The surface morphology of the deposits materials was also studied by using a scanning electron microscope(SEM) The results show that, the grain sizes decreases with increasing SnO2 content from the largest value (53.6)nm to smallest value (25.5) nm. From UV-visible spectroscopy, the distinct variations in the transmission spectra, and optical energy gap, of the thin films were also observed.

Effect of Different Oxidation Temperature on Nano and Micro TCO’s Thin Film

Mohammed S. Mohammed; Rana Osamah Mahdi; Evan Tareq Salim

Engineering and Technology Journal, 2014, Volume 32, Issue 1, Pages 7-14

In the present work, electrical structural and surface morphology of tin oxide thin films prepared using simple conventional method known as (CTO) was carried out. The obtained result insures the formation of Nano crystalline SnO2 films as a tetragonal structure. The atomic force microscope results show that film roughness depended on oxidation temperature. Minimum electrical resistivity found to be about (5.35 x 10-5 .cm) at (300°C) oxidation temperature.