Keywords : FESEM
The Effect of Sputtering Time and Substrate Type on the Structure of Zinc Nanoparticles Prepared by the DC Sputtering Technique
Engineering and Technology Journal,
2022, Volume 40, Issue 4, Pages 582-587
DOI:
10.30684/etj.v40i4.2096
Zn thin films have been successfully deposited on two different substrates, FTO and p-type Si (111), with thickness (112, 186) nm at (1 and 8) min, respectively, via DC sputtering technique in this work. Structural properties of the prepared thin films were studied using X-ray diffraction (XRD) and field-emission scanning electron microscopy (FESEM). XRD results showed that the samples have a hexagonal wurtzite structure. From the results of FESEM images, all the samples showed a uniform distribution of granular surface shape morphology. The grain sizes of the Zn thin films were estimated based on measured X-ray diffraction patterns. Zn thin film thicknesses were increased as the sputtering time increased for all substrates. The best result was the deposition of zinc nanoparticles on Si (p-type) at 1 min, where the particle size was at the peak of 7 nm.
Synthesis and Characterization of Hydroxyapatite Nano materials using chemical method
Engineering and Technology Journal,
2015, Volume 33, Issue 6, Pages 1154-1157
Synthesis natural hydroxyapatite in different nanostructure shapes and sizes such that the toxicity is reduced to the minimum for an individual application. However, the synthesis and functionalization processes are accomplished using chemical method. The morphology of the HAP nanoparticles changes from rod to spherical. Rod shaped particle are found with length between 10-20 nm while the spherical particles are found with radius less than 10 nm. But for the pure HAP only rod morphology observed with the size ranging from 30-60 nm.