Print ISSN: 1681-6900

Online ISSN: 2412-0758

Keywords : CdO thin film

Physical Properties of Cdo Thin Films Prepared by Spray Pyrolysis Technique

Douaa sulayman Jbaier

Engineering and Technology Journal, 2013, Volume 31, Issue 2, Pages 185-193

In this paper CdO films of 3.8 μm thickness were deposited onto glass and Si-wafer substrates by spray pyrolysis technique at 250oC temperature. The structure, optical and electrical properties were investigated. The structure of the films were studied by X-ray diffraction have polycrystalline structure with (111) preferential orientation. The films have good transmittances in visible and NIRregion, with direct optical band gap (2.5eV).The electrical conductivity was measured as function of temperature and theactivation energy was about(0.155and 0.241) eV.The electrical characterization of CdO/Si hetrojunction diode was investigated by current –voltage studied.The reverse current strongly increased with illumination intensity and voltage bias.

One Parameter Composite Semigroups of Linear Bounded Operators in Strong Operator Topology of Schatten Class Cp

Samir Kasim Hassan; Al-Taie M; Al-Malki Anam; Al-Attar Abeer; Mustafa Khaleel Ismael; Fatema Ahmed Sadeq; Radhi A .Zboon; Jehad R.Kider; Samir K .Hassan; Hussain J. M. Alalkawi; Raad H. Majid; Rawaa A. Alomairy; Luma Abdul Ghani Zghair; Hadia Kadhim J.Al-Ogili; Assifa M. Mohamad; Abbas Sheyaa Alwan; Haider L. Aneed; Assim H Yousif; Salema Sultan Salman; Abbas Hussien Miry; Abduladhem A.Ali; Mohammed Zeki Al-Faiz; Sabah N. mahmood; Khansaa Dawood Selman; Shaymaa Tareq Kadhim

Engineering and Technology Journal, 2011, Volume 29, Issue 8, Pages 1463-1470

For semigroups of linear bounded operators on Hilbert spaces, the problem of
being in Cp , 0 Keywords

Effect of Thickness to the Structure Properties of CdO Thin Films

Hadia Kadhim J.Al-Ogili

Engineering and Technology Journal, 2011, Volume 29, Issue 8, Pages 1536-1544

In this paper CdO thin films were prepared by using chemical bath deposition
method. Three different thicknesses of CdO films (84.1nm, 165.1nm, 194.23nm) were
used .x-ray diffraction technique has confirmed the formation of cadmium oxide,
where reveals the changes in films structure with thickness increase. Many structural
properties and constants have been studied and calculated by using the formation from
XRD patterns and ASTM chart such as grain size, FWHM, integral breadth, shape
factor, texture coefficient, and number of layers .These structural constants were
plotted as a function of the films thicknesses. The results indicate that the high grain
size (21.557nm) which was calculated for crystalline plane (111) was corresponding to
the high film thickness (194.23nm), while larger number of layer obtained for the film
thickness 165.2nm.