Author

• J.H. Khulaef

Abstract

A deposited layer of CsI has been prepared at different substrate
temperatures using spray pyrolysis technique. The X Ray diffraction of CsI
films reveals special pattern peaks (110), (200), (211), (220), (310) and (321).
From transmission spectra we calculated the energy gap of CsI films which
increase with increasing deposition temperature for direct transition is
estimated.

Keywords

• ray diffraction
• Crystallite size
• Grain size
• Cesium iodide CsI