Ministry of Higher Education and Scientific Research, Baghdad, Iraq.


Built-in Self-test (BIST) is one of integrated circuit (IC) testing techniques that can be used as a pseudo-random generator for the Circuit Under Test (CUT). This paper introduces the design and simulation of a 4-bit test pattern generator (TPG) using a one dimension Linear Hybrid Cellular Automata (LHCA) with a mixture of rule 90 and 150. LHCA is an enhancement from Linear Feedback Shift Register (LFSR) which can have more random test vectors and improving the cycle length. Design and simulation have been performed using Quartus II and Model Sim software.


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