Abstract

In this study, thin films of CuO were deposited on glass substrates using
thermal laser evaporation technique. The structure characterization of the film was
carried out with XRD. The results of XRD show that all samples have a
polycrystalline .The optical measurements on the deposited films were performed
to determine the transmission spectrum and the absorption coefficient as a
function of incident wave length. Then from the optical parameters, extinction
coefficient, dielectric constant with two part real and imaginary part, value and
type of energy gap, type of the dominant absorption processes, real and complex
refractive index as functions of incident photon energy, were determined. The
energy gap is found to be equal to 1.8 eV for CuO that is direct transfer . This
results is agree to the results given by other researchers. Then thin films annealed
thermal rapid by using halogen lamp .The annealing influence very much to thin
film by addition an enhancement to the thin films