Study of Some Properties of SnO2 Thin Film
Engineering and Technology Journal,
2013, Volume 31, Issue 12, Pages 2292-2298
10.30684/etj.31.12A.7
Abstract
In this paper thin films of Tin oxide SnO2 was prepared by spray pyrolyess methodon glass and pure silicon substrates at deposition temperature(300,400,500) Cᵒ, from Tin
chloride at concentration(0.1 M) .
The films thickness were about 0.1 ±0.02 μm and Atomization rate was about
(1 nm/s).
The test was done on prepared film by XRD and optical microscopy addition to
sensitivity to nitrous oxide gas at different test temperature (25, 50, 75,100) Cᵒ.
Result shows that the crystallization increased by increasing deposing temperature
and the sensitivity increased by rising the gas concentration or temperature.
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